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This test shall be performed for grade 3 and grade 4 products only.

The process unit and the corresponding unit shall be installed according to the manufacturer’s description with a separation distance calculated as 50 % of the specified make distance on the у-axis. If a prohibited area is described by the manufacturer, the distance of this area will be added to the previously calculated separation distance.

The test environment/installation shall allow reproducible adding and removal of the corresponding unit without any changes to the original installation distance, to simulate the locking and, for combined products, the opening and closing of the monitored object. The interference test unit shall be applied onto all exposed and accessible housing surfaces when mounted normally.

For detectors designed for installation in a ferromagnetic environment, the tests shall be performed in such an environment following the installation instructions and using the installation material (if required) by the manufacturer. For lock state contacts mounted on ferromagnetic material directly, the test shall be undertaken with the process unit placed on a steel mounting plate based on the material defined in Annex E, having dimensions of (600 x 600 x 1,6) mm. For lock state contacts mounted flush in ferromagnetic material directly, the test shall be undertaken using 2 steel mounting plates based on the material defined in Annex E, having dimensions of (200 x 200 x 1,6) mm.

The interference test unit shall be applied on all exposed surfaces reference Annex F. If due to the size of the surface it is possible to position the interference test unit on more than one position, then the test should be repeated at several randomly chosen points. Monitor the outputs of the process unit, and measure the make and break distances in accordance with 4.3.1. In case the connecting field is purely magnetic, both polarisation directions shall be tested parallel and perpendicular on each chosen point.

Pass/Fail criteria: Signals or messages shall be generated in accordance with Table 2 in the presence of the interference test unit or the detector shall continue to work normally if the make and break distances do not exceed twice the specified values.

In case of purely magnetic field based products, a further interference test shall be performed. The pure interference test magnet shall be applied at any selected area or point directly to each accessible surface of the process unit, while no other magnetic fields shall have influence (e.g. corresponding unit or interference test unit).

Pass/Fail criteria: Signals or messages shall be generated in accordance with Table 2 in the presence wherever the pure interference test magnet is; alternatively, for grade 3 products, the process unit shall stay in the state that represents an intrusion event.

For grade 4 detectors purely based on magnetic fields, the manufacturer shall supply a minimum of eight differs of coded pairs or similar means (e.g. enrol and calibration mechanism for pairing) for each detector. One process unit shall be chosen randomly and will be either tested against eight different corresponding units, alternatively the means of matching (e.g. pairing mechanism) between the process unit and the corresponding unit will be performed and the process unit will be tested with seven additional corresponding units, which had not been paired.

Pass/Fail criteria: The process unit shall only work with its corresponding unit and it shall not be possible to determine the specific pair identity by visual inspection of the detector. In case the pairing relies on a position related pairing mechanism between the process and corresponding unit, eight differs of relative positions between the units shall be supported and it shall not be possible to determine the specific pair identity by visual inspection of the detector.

If the connection between the process and the corresponding unit relies purely on digital identification means (e.g. tag number provided by a RFID field), the manufacturer shall describe the basic technology used for pairing of the process and the corresponding unit and the fundamentals of the encryption of the communication process between the paired components. Based on this information, tests shall be performed to break the communication process between the paired components and to simulate the corresponding unit or to create a copy of the corresponding unit by reading itself out and copy the content onto a similar object.

Pass/Fail criteria: With moderate effort, it shall not be possible to simulate successfully the communication process without corresponding unit or to create a copy of the corresponding unit that will work with the process unit. Furthermore, it shall not be possible to determine the specific pair identity by visual inspection of the detector.

The tests of 6.7.2 to 6.7.6 shall only be applied to detectors that require an external power supply and at the grade specified in Table 3.

The BTD given in 6.3 shall be used for verification. Connect the detector to a variable voltage stabilised power supply and allow the detector to stabilise for at least 180 s.

Connect the detector in series with a current measuring meter and connect a voltmeter across the detector’s power input terminals. Set the voltage to the nominal value. Enable the intrusion indicator if provided. Measure the current consumption whilst applying the BTD.

Pass/Fail criteria: The current consumption shall not exceed the manufacturer’s stated value by more than 20 %.

Connect the detector to a suitable variable, stabilised power supply.

Raise the supply voltage from zero by 100 mV every 1 s until the nominal voltage V - 25 % is reached, or the minimum level specified by the manufacturer, whichever is less. Allow the detector to stabilise for 180 s, carry out the BTD, and monitor the intrusion, tamper and fault signals or messages.

Reset the supply voltage to the nominal V. Raise the voltage from V by 100 mV every 1 s until the nominal voltage V + 25 % is reached, or the maximum level specified by the manufacturer, whichever is greater. Allow the detector to stabilise for 180 s, carry out the BTD, and monitor the intrusion, tamper and fault signals or messages.

Reset the supply voltage to the nominal V. Lower the voltage by 100 mV every 1 s until the nominal voltage V - 25 % is reached, or the minimum level specified by the manufacturer, whichever is less. Allow the detector to stabilise for 180 s, carry out the BTD, and monitor the intrusion and fault signals or messages.

Pass/Fail criteria, slow power supply change: There shall be no signals or messages generated by the detector during the test apart from those generated by the BTD.

Pass/Fail criteria, voltage at the range limits: There shall be no signals or messages generated by the detector during the test apart from those generated by the BTD.

Connect the detector to a signal generator with appropriate output impedance capable of generating a sinusoidal voltage of V ± 10 % superimposed on the detector nominal voltage V at a frequency of 100 Hz. Allow at least 180 s for the detector to stabilise. Apply the sinusoidal voltage for 180 s at 100 Hz.

Carry out the BTD. Observe whether any intrusion or fault signals or messages are generated.

Pass/Fail criteria: There shall be no signals or messages generated by the detector during the test apart from those generated by the BTD.

Connect the detector to a square wave generator limited to a maximum current of 1 A capable of switching from the nominal supply voltage V to the nominal voltage V ± 25 % in 1 ms.

Begin the test at the nominal voltage, and allow at least 180 s for the detector to stabilise. Carry out the BTD. Monitor intrusion, tamper, fault and any other signals or messages. Apply ten successive square wave pulses from the nominal supply voltage V to V + 25 %, of duration 5 s at intervals of 10 s. Observe whether any intrusion or fault signals or messages are generated. Repeat the BTD. Repeat the step change test for the voltage range V to V - 25 %.

Pass/Fail criteria: There shall be no signals or messages generated by the detector during the test apart from those generated by the BTD.

This test is not applicable to detectors with internal power supplies or detectors in bus systems.

Disconnect the detector from the power supply. Monitor the outputs of the detector.

Pass/Fail criteria: An intrusion signal or message shall be generated by the detector.

This test is applied to detectors that require either internal or external power supplies. Detectors having an internal battery shall be tested with the battery replaced by a variable voltage DC power supply.

Set the power supply to the nominal operating voltage of the detector. Slowly reduce the voltage below the low voltage detection point as defined by the detector manufacturer. Monitor the outputs of the detector.

Signals or messages shall be generated in accordance with Table 2.

Pass/Fail criteria: Signals or messages shall be generated in accordance with Table 1 and Table 2, by the detector at the low voltage value defined by the manufacturer. No generation of a message or signal is required when the low power condition is detected by the CIE due to system design, e.g. bus based systems.

This test shall be performed by inspection of the product and the design specifications of the product as provided by the manufacturer.

Pass/Fail criteria: The requirements defined in 4.6.8 shall be met.

Unless stated otherwise the general test conditions of 6.2 apply.

Detectors shall be subjected to the environmental conditioning described in EN 50130-5 and the EMC Product Family Standard EN 50130-4. See Table 4 and Table 5.

Detectors subjected to the operational tests are always powered and tests shall be performed at maximum settings. Detectors subjected to the endurance tests are always unpowered. Detectors that have more than one recommended mounting position shall be separately tested in each position for mechanical shock, and impact.

During the operational tests, monitor the detector for unintentional signals or messages. Due to the functional nature of the detector, unintentional signals or messages may be generated during the shock, impact and vibration tests. Generation of these signals or messages during the test shall not be considered as a test failure.

After the tests and any recovery period prescribed by the environmental test standard, carry out the BTD, and visually inspect the detector both internally and externally for signs of mechanical damage.

After the water ingress test, wipe any water droplets from the exterior of the enclosure, dry the detector, and carry out the BTD.

After the SO₂ test, detectors shall be washed and dried in accordance with the procedure prescribed in EN 60068-2-52. The BTD shall be performed immediately after drying. Carry out the access to interior test of 6.6.2.

Table 4 — Environmental tests, operational

" These tests may produce unavoidable interference that results in unwanted signals or messages.

Pass/Fail criteria: No unintentional signals or messages shall be generated during the tests except those of the BTD. There shall be no signs of mechanical damage after the tests and the detector shall continue to meet the requirements of the BTD.

Table 5 — Environmental tests, endurance

Pass/Fail criteria: There shall be no signs of mechanical damage after the tests and the detector shall continue to meet the requirements of the BTD.

Examine the detector visually to confirm that it is marked and/or identified either internally or externally in accordance with the requirements of EN 50131-1.

Pass/Fail criteria: The marking and/or identification shall be in accordance with EN 50131-1.

Examine the documentation supplied with the detector.

Pass/Fail criteria: The detector shall be supplied with clear and concise documentation meeting the requirements of this Technical Specification and EN 50131-1.Annex A
(normative)

Dimensions & requirements of standardized interference test magnets

A.1 Normative references

The interference test magnets shall comprise a magnet identical to the corresponding magnet supplied with the detector and one of the following specified independent test magnets according to whether the detector is surface or flush mounted.

The following standards will form the base for the selection of the independent test magnet:

• EN 60404-5;

• EN 60404-14;

• IEC 60404-8-1.

A.2 Requirements

The field strength of the magnet determined by the magnetic material, by remanence (B_r) in mT and the product of energy (BH)_max in kJ/m³, which are material dependent as the values describe the full saturation of that material and will be measured before any calibration took place. The actual field strength of the test magnet finally needs to be adjusted at the polarisation of the working point in mT as defined.

The relevant value, dimensions and measurement point for the test magnet can be found in the following drawings and tables. For calculations, measurements and calibration of the test magnets, the norms cited above shall be used.

The independent test magnet for surface mount opening magnetic contacts is described in Figure A.1.

To get the magnets in question adjusted to the proper values and calibrated (e.g. polarisation in working point), it is strongly suggested to perform adjustments of the magnetic values for ordered magnets performed by an accredited test house for magnetic fields. One potential source could be the following:

MAGNET-PHYSIK

Dr. Steingroever GmbH

Emil-Hoffmann-Strasse 3

50966 Cologne, Germany

www.maqnet-phvsik.deDimensions in millimetres

Key

1 North pole

2 South pole

3 North pole

Figure A.1 —Test magnet for surface mount opening magnetic contacts

The independent test magnet for flush mount opening magnetic contacts is described in Figure A.2.Dimensions in millimetres

Key

1 North pole

2. South pole

3. North pole

Figure A.2 — Test magnet for flush mount opening magnetic contacts

Annex В
(normative)

General testing matrix

Table B.1 — General testing matrix